Bengaluru, India

Srinivas Kumar Naru

This inventor holds 2 USPTO granted patents and 1 published patent application. Top assignee: Texas Instruments Corporation. Active years: 2023-2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Srinivas Kumar Naru. Retrieved from https://idiyas.com/inventor/srinivas-kumar-naru

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 2 

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2023-2024

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2 patents (USPTO):Explore Patents

Title: Srinivas Kumar Naru: ADC Calibration Innovation

Introduction

Srinivas Kumar Naru is an inventor based in Bengaluru, India, whose patent work includes techniques for improving analog-to-digital converter performance. He is associated with Texas Instruments Corporation and is credited with 2 patents.

Latest Patents

Naru’s listed latest patent is “Auxiliary ADC-Based Calibration for Non-Linearity Correction of ADC.” The invention describes a system with an input channel, a voltage-to-delay converter, a primary analog-to-digital converter (ADC), and an auxiliary ADC. Calibration circuitry compares the signal provided to the primary ADC with the signal provided to the auxiliary ADC to determine and correct signal non-linearity.

Career Highlights

The patent reflects work on calibration methods that can address non-linearity in ADC input signals. Such techniques are relevant to the accuracy and performance of electronic systems that rely on analog-to-digital conversion.

Collaborations

Naru’s listed coworkers include Nagarajan Viswanathan and Charls Babu. The available information identifies his association with Texas Instruments Corporation but does not specify their roles in the patent.

Conclusion

Srinivas Kumar Naru’s patent portfolio includes an ADC calibration approach designed to correct signal non-linearity, highlighting his contributions to electronic measurement and conversion technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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