Oak Ridge, TN, United States of America

Srijib K Mukherjee

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Ut-Battelle, Inc.. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Srijib K Mukherjee. Retrieved from https://idiyas.com/inventor/srijib-k-mukherjee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Srijib K Mukherjee: Innovator in Device Validation

Introduction

Srijib K Mukherjee is an accomplished inventor based in Oak Ridge, TN (US). He has made significant contributions to the field of device validation, particularly in the context of power systems. His innovative approach addresses a common challenge faced by engineers and technicians in the industry.

Latest Patents

Srijib holds 1 patent for a system and method of device validation. This patent, titled "System and method of device validation," focuses on identifying pinout information for an Intelligent Electronic Device (IED). The invention aims to test the IED in accordance with a power system, overcoming the limitations of conventional testing systems that often lack pinout information.

Career Highlights

Srijib K Mukherjee is associated with UT-Battelle, Inc., where he applies his expertise in developing innovative solutions for power systems. His work has been instrumental in enhancing the efficiency and reliability of testing methods for IEDs.

Collaborations

Srijib has collaborated with notable colleagues, including Emilio Charles Piesciorovsky and Travis M Smith. These partnerships have contributed to the advancement of technology in the field of device validation.

Conclusion

Srijib K Mukherjee's contributions to the field of device validation exemplify the importance of innovation in addressing industry challenges. His work continues to influence the development of more effective testing systems for power systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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