Sunnyvale, CA, United States of America

Spencer Purdy

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Instrumental, Inc.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Spencer Purdy. Retrieved from https://idiyas.com/inventor/spencer-purdy

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Spencer Purdy: Innovator in Manufacturing Defect Prediction

Introduction

Spencer Purdy is a notable inventor based in Sunnyvale, California. He has made significant contributions to the field of manufacturing through his innovative patent. His work focuses on improving the quality control processes in assembly units.

Latest Patents

Spencer Purdy holds a patent for a "Method for predicting defects in assembly units." This invention involves a sophisticated approach to identifying potential manufacturing defects. The method includes accessing a first set of inspection images from an optical inspection station, generating vectors from these images, and grouping them in a multi-dimensional feature space. It also involves analyzing a second inspection image to detect features and flagging any deviations that exceed a predetermined threshold.

Career Highlights

Spencer is currently employed at Instrumental, Inc., where he applies his expertise in manufacturing and quality assurance. His innovative approach has the potential to enhance the efficiency and reliability of production processes.

Collaborations

Some of his coworkers include Samuel Bruce Weiss and Reilly Hayes, who contribute to the collaborative environment at Instrumental, Inc. Their combined efforts foster innovation and drive advancements in manufacturing technology.

Conclusion

Spencer Purdy's work exemplifies the impact of innovation in manufacturing, particularly through his patented method for predicting defects. His contributions are paving the way for improved quality control in assembly processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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