Ludwigshafen, Germany

Sourabh Kulkarni

This inventor holds 1 USPTO granted patent. Top assignee: Trinamix Gmbh. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sourabh Kulkarni. Retrieved from https://idiyas.com/inventor/sourabh-kulkarni-7zm007as

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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% Patents Active = 100.0

Average Co-Inventor Count = 3.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: The Innovative Journey of Sourabh Kulkarni

Introduction

Sourabh Kulkarni is a notable inventor based in Ludwigshafen am Rhein, Germany. He has made significant contributions to the field of optical measurement technology. His work focuses on developing advanced devices that enhance the accuracy and efficiency of spectral measurements.

Latest Patents

Sourabh Kulkarni holds a patent for a "Multi single detector application specific spectrometer." This spectral measurement device is designed to measure optical radiation from at least one measurement object through a classification-based spectral measurement approach. The device includes an evaluation component that generates measurement information by applying a classification model and a transfer function to the spectral data.

Career Highlights

Sourabh is currently employed at Trinamix GmbH, where he continues to innovate in the field of optical measurement. His expertise and dedication to advancing technology have positioned him as a key player in his company.

Collaborations

Sourabh collaborates with Christoph Prokop, working together to push the boundaries of spectral measurement technology.

Conclusion

Sourabh Kulkarni's contributions to the field of optical measurement through his innovative patent and work at Trinamix GmbH highlight his role as a significant inventor in the industry. His dedication to advancing technology continues to inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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