Hyderabad Telangana, India

Soumitra Kumar Bhowmick

This inventor holds 1 USPTO granted patent. Top assignee: Xilinx, Inc.. Active years: 2019.


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Soumitra Kumar Bhowmick: Innovator in Non-Destructive Testing Technologies

Introduction

Soumitra Kumar Bhowmick is a prominent inventor based in Hyderabad, Telangana, India. He has made significant contributions to the field of integrated circuit testing, particularly in non-destructive methodologies. His innovative approach has the potential to enhance the safety and reliability of critical applications in technology.

Latest Patents

Bhowmick holds a patent for a groundbreaking invention titled "Non-destructive online testing for safety critical applications." This patent describes a methodology for performing non-destructive LBIST (Logic Built-In Self-Test) when booting an integrated circuit (IC). In this innovative process, the IC begins its boot sequence, such as a Power-On Self-Test (POST), which is then temporarily paused to conduct LBIST. Importantly, this method ensures that the boot mode state of the IC remains intact, allowing the booting process to resume seamlessly after the LBIST is completed. He has 1 patent to his name.

Career Highlights

Soumitra Kumar Bhowmick is currently employed at Xilinx, Inc., a leading company in the field of programmable logic devices. His work at Xilinx has allowed him to apply his expertise in integrated circuit design and testing, contributing to advancements in the industry.

Collaborations

Throughout his career, Bhowmick has collaborated with talented professionals, including Banadappa V Shivaray and Pranjal Chauhan. These collaborations have fostered a creative environment that encourages innovation and the development of cutting-edge technologies.

Conclusion

Soumitra Kumar Bhowmick is a notable inventor whose work in non-destructive testing methodologies is paving the way for safer and more reliable integrated circuits. His contributions to the field are invaluable and continue to influence advancements in technology.

Profile summary based on public USPTO records.
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