Yokosuka, Japan

Souhei Miura

This inventor holds 1 USPTO granted patent. Top assignee: Nifco Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Souhei Miura. Retrieved from https://idiyas.com/inventor/souhei-miura

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Souhei Miura: Inventor of an Improved Clip Attachment Structure.

Introduction

Souhei Miura is an inventor based in Yokosuka, Japan, associated with Nifco Inc. His patent work includes an invention designed to improve how a clip is guided and attached to a mounting member.

Latest Patents

Miura is credited with 1 patent: “Clip and Clip Attachment Structure.” The invention describes a two-member clip. One member has a base, a projecting pin, and a recess or through-hole that receives part of the second member. The second member includes a tube that fits into a mounting hole and rotates around the pin, along with an inserted portion that engages with the first member. A guide around the receiving feature helps direct the inserted portion into place as the pin enters the tube.

Career Highlights

Miura’s listed patent reflects work on practical fastening components and their attachment structures. The design focuses on guiding the clip’s parts into engagement, supporting a more controlled assembly process.

Collaborations

The patent is associated with Nifco Inc., a company known for fastening and plastic component technologies. This association connects Miura’s invention to the development of components used in mounting and attachment applications.

Conclusion

Souhei Miura’s patent presents a guided, rotatable clip structure intended to make component engagement more reliable, highlighting his contribution to fastening technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…