Osaka, Japan

Souhei Kanouda


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 76(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Souhei Kanouda: Innovator in Flow Sensor Technology

Introduction

Souhei Kanouda is a notable inventor based in Osaka, Japan. He has made significant contributions to the field of flow sensor technology, particularly with his innovative designs that enhance measurement accuracy and efficiency.

Latest Patents

Kanouda holds a patent for a split-flow-type flow sensor device. This device features a main flow passage and a bypass flow passage, with a thermal flow sensor strategically placed on the wall face of the bypass flow passage. The design includes a first rectification member located upstream from a diversion part to the bypass flow passage in the main flow passage, and a second rectification member positioned upstream from the thermal flow sensor in the bypass flow passage. A bypass flow passage module is inserted into an opening formed on the side of a main flow passage module, ensuring that the side opening of the main flow passage module is sealed, while the entrance and exit of the bypass flow passage are effectively positioned within the main flow passage.

Career Highlights

Kanouda is associated with Keyence Corporation, a leading company in the field of automation and sensing technology. His work at Keyence has allowed him to focus on developing advanced sensor technologies that are widely used in various industries.

Collaborations

Throughout his career, Kanouda has collaborated with esteemed colleagues such as Susumu Takayanagi and Kiyoshi Hama. These collaborations have contributed to the advancement of sensor technology and have fostered innovation within the field.

Conclusion

Souhei Kanouda's contributions to flow sensor technology exemplify his dedication to innovation and excellence. His patent for the split-flow-type flow sensor device showcases his ability to create effective solutions for complex measurement challenges.

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