Company Filing History:
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1 out of 1 Years Active: 2025
Title: Sotero Ordoñes Nogales: Innovator in Moiré Profilimetry
Introduction
Sotero Ordoñes Nogales is a notable inventor based in Guanajuato, Mexico. He has made significant contributions to the field of profilimetry, particularly through his innovative methods and systems.
Latest Patents
Sotero holds a patent for a "Method and system for moiré profilimetry using simultaneous dual fringe projection." This invention involves analyzing the topography of an object by projecting dual patterns onto its surface from two symmetric directions. The projected patterns superimpose to create a fringe pattern that contains a moiré pattern, which is modulated according to the object's topography. The moiré pattern can be extracted and demodulated using spatial or temporal methods, enhancing the accuracy of topographical analysis.
Career Highlights
Throughout his career, Sotero has worked with reputable institutions, including the San Diego State University Foundation and the Centro de Investigaciones en Óptica A.C. His work in these organizations has allowed him to further develop his expertise in optical technologies and profilimetry.
Collaborations
Sotero has collaborated with various professionals in his field, including his coworker Sungbum Kang. Their joint efforts have contributed to advancements in optical measurement techniques.
Conclusion
Sotero Ordoñes Nogales is a distinguished inventor whose work in moiré profilimetry has paved the way for innovative approaches in topographical analysis. His contributions continue to influence the field of optical technologies.