This inventor holds 1 USPTO granted patent. Top assignee: Kirin Beer Kabushiki Kaisha. Active years: 1986.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1986
Title: Sosuke Tateishi: Innovator in Defect Detection Technology
Introduction
Sosuke Tateishi is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of defect detection technology, particularly through his innovative patent. His work is essential in enhancing the quality control processes in various industries.
Latest Patents
Sosuke Tateishi holds a patent for a defect detecting method and system. This invention involves illuminating the surface of an inspected part with light rays emitted through an annular portion that is coaxially aligned with the surface. The reflected light rays are then captured to create an image of the inspected part. The image consists of pixels that correspond to different sections of the surface. Signals indicating the brightness of these pixels are stored based on their respective positions. This data is analyzed to determine the presence of defects by comparing the signals against preset values.
Career Highlights
Sosuke Tateishi is currently employed at Kirin Beer Kabushiki Kaisha, where he applies his expertise in defect detection. His innovative approach has contributed to the company's commitment to quality and precision in its products. With a focus on technological advancement, he continues to push the boundaries of what is possible in defect detection.
Collaborations
Throughout his career, Sosuke has collaborated with talented individuals such as Takashi Miyazawa and Hiroyuki Fukuchi. These partnerships have fostered a creative environment that encourages innovation and the development of cutting-edge technologies.
Conclusion
Sosuke Tateishi's contributions to defect detection technology exemplify the impact of innovation in industry. His patent and collaborative efforts highlight the importance of quality control in manufacturing processes. Through his work, he continues to inspire advancements in technology and quality assurance.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
