This inventor holds 2 USPTO granted patents. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2004-2005.
Company Filing History:
Years Active: 2004-2005
Title: Innovations of Soo-Min Byun
Introduction
Soo-Min Byun is a notable inventor based in Yongin, South Korea. He has made significant contributions to the field of testing apparatuses, particularly in the realm of integrated circuits. With a total of 2 patents, his work has garnered attention for its innovative approaches to testing and cleaning probe card contacts.
Latest Patents
Soo-Min Byun's latest patents include a "Probe needle test apparatus and method" and an "Apparatus and method for cleaning probe card contacts." The probe needle test apparatus features a substrate retainer, a probe card, a tester, a test head, and a main controller. This apparatus is designed to hold a substrate with multiple chips and conduct tests by generating and analyzing signals. The main controller also includes a database for storing test data and executing a cleaning error detection program. The second patent focuses on an apparatus and method for cleaning debris from electrical contacts of a test probe card. This innovative solution utilizes a silicon wafer with a grooved surface to effectively remove residue particles from the probe card.
Career Highlights
Soo-Min Byun is currently employed at Samsung Electronics Co., Ltd., where he continues to develop and refine his inventions. His work at this leading technology company has allowed him to contribute to advancements in testing technologies for integrated circuits.
Collaborations
Some of his coworkers include Byoung-Joo Kim and Joon-Su Ji, who collaborate with him on various projects within the company.
Conclusion
Soo-Min Byun's contributions to the field of testing apparatuses demonstrate his innovative spirit and commitment to advancing technology. His patents reflect a deep understanding of the challenges in integrated circuit testing and cleaning, making him a valuable asset in the industry.