Hattiesburg, MS, United States of America

Song Zhang


Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Song Zhang - Innovator in Thin Film Mechanical Analysis

Introduction

Song Zhang is a prominent inventor based in Hattiesburg, MS (US). He has made significant contributions to the field of material characterization, particularly in the analysis of nano-scale thin films. His innovative work has led to the development of methodologies and instrumentation that enhance our understanding of the mechanical properties of these materials.

Latest Patents

Song Zhang holds a patent for a groundbreaking invention titled "Methodology and instrumentation for thin film mechanical analysis." This invention provides a comprehensive system and method for measuring the mechanical properties of ultra-thin films. The system includes a motor and load cell, along with an instrumentation device that features a bath capable of holding liquid. This allows a thin film to float on the surface tension and be stretched until permanent deformation occurs, while simultaneously recording the force applied by the motor and other relevant parameters. The invention also outlines a process for transferring the nano-scale thin film to a tensile testing instrument, enabling the acquisition of physical mechanical properties at the nanoscale level. He has 1 patent to his name.

Career Highlights

Song Zhang is affiliated with the University of Southern Mississippi, where he continues to advance research in material science. His work is pivotal in the development of new techniques for analyzing thin films, which have applications in various industries, including electronics and materials engineering.

Collaborations

Some of his notable coworkers include Xiaodan Gu and Dakota F Ehlenberg. Their collaborative efforts contribute to the ongoing research and development in the field of thin film analysis.

Conclusion

In summary, Song Zhang is an influential inventor whose work in thin film mechanical analysis is shaping the future of material characterization. His innovative methodologies and instrumentation are essential for advancing our understanding of nano-scale materials.

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