The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 25, 2025
Filed:
May. 01, 2019
The University of Southern Mississippi, Hattiesburg, MS (US);
Xiaodan Gu, Hattiesburg, MS (US);
Dakota F. Ehlenberg, Baton Rouge, LA (US);
Song Zhang, Hattiesburg, MS (US);
The University of Southern Mississippi, Hattiesburg, MS (US);
Abstract
The invention provides for a material characterization system, method, and instrumentation for measuring the mechanical properties of nano-scale thin films. The thin film mechanical characterization system, method, and instrumentation of the present invention for ultra-thin films includes a motor and load cell. The instrumentation device includes a bath that can be filled or used with liquid so that a thin film can float via the surface tension and can be stretched until permanent deformation occurs, while recording the amount of force applied by the motor and other parameters. Further, the invention provides a process that transfers the nano-scale thin film to the tensile testing instrument and a process to obtain the physical mechanical properties of thin films that are at the nanoscale level.