Company Filing History:
Years Active: 2025
Title: Dakota F Ehlenberg: Innovator in Thin Film Mechanical Analysis
Introduction
Dakota F Ehlenberg is an accomplished inventor based in Baton Rouge, LA (US). He has made significant contributions to the field of material characterization, particularly in the analysis of nano-scale thin films. His innovative approach has led to the development of a unique methodology and instrumentation that enhances the understanding of mechanical properties at the nanoscale.
Latest Patents
Ehlenberg holds a patent for a groundbreaking invention titled "Methodology and instrumentation for thin film mechanical analysis." This invention provides a comprehensive system for measuring the mechanical properties of ultra-thin films. The system includes a motor and load cell, along with an instrumentation device that features a bath capable of holding liquid. This allows a thin film to float on the surface tension and be stretched until permanent deformation occurs, while simultaneously recording the force applied and other critical parameters. The invention also outlines a process for transferring the nano-scale thin film to a tensile testing instrument, enabling the acquisition of physical mechanical properties at the nanoscale level. Ehlenberg has 1 patent to his name.
Career Highlights
Ehlenberg is affiliated with the University of Southern Mississippi, where he continues to advance research in material science. His work has garnered attention for its innovative approach to thin film analysis, contributing to the broader understanding of material properties in various applications.
Collaborations
Ehlenberg has collaborated with notable colleagues, including Xiaodan Gu and Song Zhang, who have contributed to his research endeavors. Their combined expertise has furthered the development of methodologies in material characterization.
Conclusion
Dakota F Ehlenberg is a pioneering inventor whose work in thin film mechanical analysis is shaping the future of material science. His innovative methodologies and instrumentation are essential for advancing the understanding of mechanical properties at the nanoscale.