Yao, Japan

Soichi Onishi

This inventor holds 2 USPTO granted patents. Top assignee: Sharp Kabushiki Kaisha Corporation. Active years: 1982.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Soichi Onishi. Retrieved from https://idiyas.com/inventor/soichi-onishi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 1982

Loading Chart...
2 patents (USPTO):Explore Patents

Title: Soichi Onishi: Patent Inventor in Yao, Japan

Introduction

Soichi Onishi is an inventor associated with Yao, Japan. His recorded patent work includes two patents concerning data recording and playback, and he is associated with Sharp Kabushiki Kaisha Corporation.

Latest Patents

Onishi’s listed patents address recording and reading check data and true data on cassette tape. One describes a data reader that amplifies signals from a magnetic-tape reproduction head and checks whether the signal level is sufficient. If the level is too low, the device alerts the operator; once the level is adequate, the reader enables data detection and readout.

A related patent describes recording check signals in one section of a cassette tape and true signals in another. The true signals are recorded after the check-signal volume has been adjusted adequately. The reader checks the level of playback signals, announces when volume adjustment is needed, and reads the true data.

Career Highlights

Onishi’s listed work focuses on signal-level checking and reliable data recording and playback. His patent record includes 2 patents.

Collaborations

Onishi’s listed coworker is Shigeru Kitano. His company association is Sharp Kabushiki Kaisha Corporation.

Conclusion

Soichi Onishi’s patent work centers on cassette-tape data systems that verify signal levels before recording or reading true data.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…