Los Altos Hills, CA, United States of America

Slawomir K Ilnickl

This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Slawomir K Ilnickl. Retrieved from https://idiyas.com/inventor/slawomir-k-ilnickl

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:

goldMedal1 out of 834,570 
Other
 patents

Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Slawomir K Ilnickl

Introduction

Slawomir K Ilnickl is a notable inventor based in Los Altos Hills, California. He has made significant contributions to the field of data inspection technology. His innovative approach has led to the development of a unique patent that enhances the efficiency of data packet handling.

Latest Patents

Slawomir holds a patent for an in-band inspection device that inspects data packets and frames "on the fly." This device is capable of accepting, rejecting, and modifying received packets and frames based on the inspection criteria. It operates in two modes: a fast mode, where packets are transmitted immediately upon receiving a port address, and a slow mode, where packets are buffered until the CRC is received. This innovation showcases his ability to improve data processing technologies.

Career Highlights

Throughout his career, Slawomir has focused on developing advanced technologies that streamline data inspection processes. His work has been instrumental in enhancing the performance of network systems. With a patent count of 1 patent, he continues to push the boundaries of what is possible in his field.

Collaborations

Slawomir collaborates with Martin Curran-Gray, a fellow innovator. Their partnership exemplifies the spirit of teamwork in the pursuit of technological advancements.

Conclusion

Slawomir K Ilnickl is a remarkable inventor whose contributions to data inspection technology have made a lasting impact. His innovative patent reflects his dedication to improving data handling processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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