Hangzhou, China

Siwang Li

This inventor holds 1 USPTO granted patent. Top assignee: Alibaba Group Holding Limited. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Siwang Li. Retrieved from https://idiyas.com/inventor/siwang-li

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Siwang Li: Spatial Modeling and Patent Innovation.

Introduction

Siwang Li is an inventor associated with Hangzhou, China, and Alibaba Group Holding Limited. His patent work includes a method for determining wall lines in panoramic images and using them to create three-dimensional models of indoor spaces.

Latest Patents

The provided information lists one patent for Siwang Li: “Method for Wall Line Determination, Method, Apparatus, and Device for Spatial Modeling.” The disclosed approach acquires a panoramic image captured in a space, identifies wall lines using Manhattan-World structural features of wall surfaces, and constructs a three-dimensional model based on those lines. This method connects image analysis with spatial modeling.

Career Highlights

Li’s listed patent reflects work on techniques for interpreting indoor environments from panoramic imagery. The supplied information associates him with Alibaba Group Holding Limited and records 1 patent.

Collaborations

The provided information names Xiaoxu Leng and Jingming Yu as Li’s coworkers. Their inclusion indicates professional connections, though no specific joint patent or project details were supplied.

Conclusion

Siwang Li’s listed invention applies panoramic-image analysis to wall-line detection and three-dimensional spatial modeling, highlighting his contribution to patent innovation in this area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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