Sivan Hurvitz

Title: Sivan Hurvitz: Innovator in Photogrammetric Measurement

Introduction

Sivan Hurvitz is a notable inventor based in Ramat Gan, Israel. She has made significant contributions to the field of photogrammetric measurement, particularly in applications related to infant height estimation and measurement calibration.

Latest Patents

Sivan holds 3 patents that showcase her innovative approaches. One of her latest patents is focused on infant height estimation. This method involves capturing a sequence of images of an infant lying in a crib and processing these images to extract the infant's skeleton. The height of the infant is then estimated based on the extracted skeleton. Another patent addresses measurement calibration using patterned sheets. This method includes providing a bedsheet with specific patterns printed according to a template. An image of a person lying on the bed is processed to identify and match these patterns, allowing for accurate dimension measurement.

Career Highlights

Sivan is currently associated with Udisense Inc., where she continues to develop her innovative ideas. Her work has garnered attention for its practical applications in healthcare and measurement technologies.

Collaborations

Sivan collaborates with talented individuals such as Amnon Karni and Dror Porat, contributing to a dynamic work environment that fosters innovation.

Conclusion

Sivan Hurvitz is a pioneering inventor whose work in photogrammetric measurement is making a significant impact. Her innovative patents reflect her commitment to advancing technology in meaningful ways.