Düsseldorf, Germany

Sirik Rutger Leliveld

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Other. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sirik Rutger Leliveld. Retrieved from https://idiyas.com/inventor/sirik-rutger-leliveld

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:

goldMedal1 out of 834,570 
Other
 patents

Years Active: 2014

Loading Chart...
Loading Chart...
1 patent (USPTO):Explore Patents

Title: Sirik Rutger Leliveld: A Profile of Innovation

Introduction

Sirik Rutger Leliveld is an inventor based in Neuss, Germany. He has made contributions to the field of innovation, although he currently holds no patents. His career has been marked by his work with notable companies and collaborations with esteemed colleagues.

Latest Patents

As of now, Sirik Rutger Leliveld has not registered any patents. This indicates that his innovative contributions may be in the early stages or focused on collaborative projects rather than individual patent filings.

Career Highlights

Throughout his career, Sirik has worked with several companies, including Korth and Stitz. His experience in these organizations has likely provided him with valuable insights and skills in the field of innovation.

Collaborations

Sirik has collaborated with notable coworkers such as Carsten Korth and Lothar Stitz. These partnerships may have influenced his approach to innovation and development.

Conclusion

Sirik Rutger Leliveld is an emerging figure in the world of innovation, with a career that reflects his dedication to the field. His collaborations and experiences with various companies highlight his potential for future contributions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…