Sina Jahanbin

Title: Innovations of Sina Jahanbin in Image Processing

Introduction

Sina Jahanbin is an accomplished inventor based in Austin, TX. He has made significant contributions to the field of image processing, particularly in the detection of textural defects. His innovative approach utilizes advanced machine learning techniques to enhance image analysis.

Latest Patents

Sina Jahanbin holds a patent for a method titled "Detection of textural defects using a one-class support vector machine." This patent describes a process for detecting textural defects in an image, which may have an irregular visual texture. The method involves receiving the image, decomposing it into multiple subbands, and partitioning it into several sections. For each partition, a plurality of grey-level co-occurrence matrices (GLCMs) is determined, and second-order statistical attributes are extracted. A feature vector is constructed for each partition, which includes these statistical attributes. The classification of the partitions is performed using a one-class support vector machine to determine the presence of defects in the image.

Career Highlights

Sina has worked with notable organizations such as National Instruments Corporation and the University of Texas System. His experience in these institutions has allowed him to refine his skills and contribute to various projects in the field of image processing.

Collaborations

Some of his notable coworkers include Alan C Bovik and Eduardo Perez. Their collaboration has likely enriched the research and development efforts in which they have been involved.

Conclusion

Sina Jahanbin's innovative work in image processing, particularly through his patented method for detecting textural defects, showcases his expertise and contributions to the field. His career reflects a commitment to advancing technology and improving image analysis techniques.