The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2013
Filed:
Dec. 07, 2009
Sina Jahanbin, Austin, TX (US);
Alan C. Bovik, Austin, TX (US);
Eduardo Perez, Cedar Park, TX (US);
Dinesh Nair, Austin, TX (US);
Sina Jahanbin, Austin, TX (US);
Alan C. Bovik, Austin, TX (US);
Eduardo Perez, Cedar Park, TX (US);
Dinesh Nair, Austin, TX (US);
National Instruments Corporation, Austin, TX (US);
Board of Regents of the University of Texas System, Austin, TX (US);
Abstract
Method for detecting textural defects in an image. The image, which may have an irregular visual texture, may be received. The image may be decomposed into a plurality of subbands. The image may be portioned into a plurality of partitions. A plurality of grey-level co-occurrence matrices (GLCMs) may be determined for each partition. A plurality of second-order statistical attributes may be extracted for each GLCM. A feature vector may be constructed for each partition, where the feature vector includes the second order statistical attributes for each GLCM for the partition. Each partition may be classified based on the feature vector for the respective partition. Classification of the partitions may utilize a one-class support vector machine, and may determine if a defect is present in the image.