Aix-en-Provence, France

Simon Landry

This inventor holds 1 USPTO granted patent. Top assignee: Stmicroelectronics (Rousset) Sas. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Simon Landry. Retrieved from https://idiyas.com/inventor/simon-landry-gase29b9

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Simon Landry: Innovator in Fault Detection Technology

Introduction

Simon Landry is a notable inventor based in Aix-en-Provence, France. He has made significant contributions to the field of fault detection through his innovative patent. His work is particularly relevant in the context of electronic circuits and their applications.

Latest Patents

Simon Landry holds a patent related to fault detection. The patent describes a method for detecting faults in an application by an electronic circuit. This method involves generating a non-zero even number N of different first sets from a message, each containing P shares. It further applies one or more second functions to the P shares of each first set, resulting in a second set that includes Q images. The process culminates in cumulating all images, starting with at most Q-images selected from the Q images of a single second set.

Career Highlights

Simon Landry is currently employed at STMicroelectronics (Rousset) Sas, where he continues to develop and refine his innovative ideas. His work at this leading technology company allows him to contribute to advancements in electronic circuit applications.

Collaborations

Simon collaborates with his coworker, Yanis Linge, to further enhance their projects and innovations in the field of fault detection.

Conclusion

Simon Landry's contributions to fault detection technology exemplify the impact of innovative thinking in the electronics industry. His patent and ongoing work at STMicroelectronics highlight his commitment to advancing technology and improving electronic applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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