Wilmette, IL, United States of America

Simon C Schlachter


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 14(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Simon C Schlachter: Innovator in Microscale Measurement and Imaging

Introduction

Simon C Schlachter is a notable inventor based in Wilmette, IL (US). He has made significant contributions to the field of optical measurement and imaging. His innovative work focuses on the microscale measurement of the group refractive index, which has important applications in various scientific fields.

Latest Patents

Simon C Schlachter holds a patent for a system and method titled "Group refractive index reconstruction with broadband interferometric confocal microscopy." This invention provides a sophisticated approach for microscale measurement and imaging of the group refractive index of a sample. The method employs a broadband confocal high-numerical aperture microscope integrated into an interferometer, along with a spectrometric means. By analyzing spectral interferograms, the optical path delay of the beam traversing the sample is computed as the sample is translated through the focus of an interrogating light beam. This determination of group refractive index helps to resolve phase ambiguity in refractive index measurements at specific wavelengths. The invention achieves spatial resolution of object characterization in three dimensions by imaging the object from multiple viewpoints.

Career Highlights

Simon C Schlachter is affiliated with the University of Illinois, where he continues to advance research in optical technologies. His work has garnered attention for its innovative approach to complex measurement techniques. Schlachter's contributions are vital in enhancing the understanding of optical properties in various materials.

Collaborations

He has collaborated with esteemed colleagues, including Daniel L Marks and Stephen A Boppart. These partnerships have further enriched his research and development efforts in the field of optical measurement.

Conclusion

Simon C Schlachter's innovative work in microscale measurement and imaging exemplifies the impact of advanced optical technologies. His contributions continue to influence the scientific community and pave the way for future innovations in the field.

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