The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 10, 2012
Filed:
Dec. 03, 2008
Daniel L. Marks, Chapel Hill, NC (US);
Stephen A. Boppart, Champaign, IL (US);
Adam M. Zysk, Chicago, IL (US);
Simon C. Schlachter, Wilmette, IL (US);
Daniel L. Marks, Chapel Hill, NC (US);
Stephen A. Boppart, Champaign, IL (US);
Adam M. Zysk, Chicago, IL (US);
Simon C. Schlachter, Wilmette, IL (US);
The Board of Trustees of the University of Illinois, Urbana, IL (US);
Abstract
A system and method for microscale measurement and imaging of the group refractive index of a sample. The method utilizes a broadband confocal high-numerical aperture microscope embedded into an interferometer and a spectrometric means, whereby spectral interferograms are analyzed to compute optical path delay of the beam traversing the sample as the sample is translated through the focus of an interrogating light beam. A determination of group refractive index may serve to disambiguate phase ambiguity in a measurement of refractive index at a specified wavelength. Spatial resolution of object characterization in three dimensions is achieved by imaging the object from multiple viewpoints.