McKinney, TX, United States of America

Simeon Symeonidis

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Raytheon Company. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Simeon Symeonidis. Retrieved from https://idiyas.com/inventor/simeon-symeonidis

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

 

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2017

Loading Chart...
Loading Chart...
1 patent (USPTO):Explore Patents

Title: Simeon Symeonidis: Sensor-Imaging Innovation

Introduction

Simeon Symeonidis is an inventor based in McKinney, Texas, and is associated with Raytheon Company. His patent work addresses how a single sensor can provide imagery at different resolutions and frame rates.

Latest Patents

Symeonidis is named on 1 patent: “Method and Apparatus for Integrated Sensor to Provide Higher Resolution, Lower Frame Rate and Lower Resolution, Higher Frame Rate Imagery Simultaneously.” The invention describes producing high-resolution imagery at a first frame rate, such as a typical video rate, while also generating lower-resolution imagery at a faster second frame rate. In one embodiment, a user can view the first stream while the second stream is processed to detect an event of interest, such as pulsed light.

Career Highlights

The patent reflects work on integrated sensor systems that balance image detail with faster event detection. This approach can support applications where users need clear imagery while a system monitors for rapidly occurring events.

Collaborations

The patent lists James F. Asbrock and Richard H. Wyles as coworkers associated with the work. Symeonidis’s company affiliation is Raytheon Company.

Conclusion

Simeon Symeonidis’s patented sensor-imaging method combines high-resolution viewing with faster, lower-resolution monitoring, illustrating an approach to capturing detail while detecting events promptly.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…