Neuchâtel, Switzerland

Silvain Herminjard


Average Co-Inventor Count = 12.0

ph-index = 1

Forward Citations = 114(Granted Patents)


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Innovations in Wave Front Sensing by Silvain Herminjard

Introduction

Silvain Herminjard is an accomplished inventor based in Neuchâtel, Switzerland. He has made significant contributions to the field of wave front sensing, particularly through his innovative patent that combines instrumental and digital techniques. His work has implications for both research and industrial applications, enhancing the performance of wave front sensing instruments.

Latest Patents

Herminjard holds a patent for a "Wave front sensing method and apparatus." This invention introduces a novel approach to wave front sensing by utilizing digital wave front operators (DWFO) or digital lenses (DL). These operators are specifically designed for the digital processing of wave fronts defined in amplitude and phase. The invention addresses the correction of undesired wave front deformations caused by instrumental defects or experimental errors. Automated and semi-automated procedures for calibrating the coefficients of these operators are also described, enhancing the accuracy and efficiency of wave front sensing techniques.

Career Highlights

Silvain Herminjard is associated with Lyncee Tec SA, a company that focuses on advanced optical technologies. His work at Lyncee Tec has allowed him to explore and develop innovative solutions in wave front sensing, contributing to the advancement of imaging and metrology techniques. His patent has opened new avenues for applications in material and life sciences.

Collaborations

Herminjard has collaborated with notable colleagues, including Tristan Colomb and Etienne Cuche. Their combined expertise has furthered the development of wave front sensing technologies and has contributed to the success of their projects.

Conclusion

Silvain Herminjard's contributions to wave front sensing through his innovative patent demonstrate the potential for advancements in imaging and metrology. His work not only improves the performance of existing technologies but also expands the field of applications in various scientific domains.

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