Forchheim, Germany

Silke Reitz


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2016-2017

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2 patents (USPTO):Explore Patents

Title: Silke Reitz: Innovator in X-ray Technology

Introduction

Silke Reitz is a prominent inventor based in Forchheim, Germany. She has made significant contributions to the field of X-ray technology, particularly in the calibration of digital X-ray detectors. With a total of 2 patents, her work has advanced the capabilities of X-ray imaging systems.

Latest Patents

Silke Reitz's latest patents include a method for calibrating a counting digital X-ray detector and an X-ray system designed to perform this method. The calibration method involves conducting a threshold value scan in a defined X-ray spectrum to irradiate the X-ray detector, which consists of a matrix of pixel elements. The process includes storing count rates of the pixel elements based on the applied threshold values. From these measurements, individual correction threshold values are determined for each pixel element. This innovation aims to reduce threshold value noise, enhancing the accuracy and reliability of X-ray images.

Career Highlights

Throughout her career, Silke Reitz has worked with notable companies such as Siemens Aktiengesellschaft and Siemens Healthcare GmbH. Her experience in these organizations has allowed her to develop and refine her expertise in X-ray technology and imaging systems.

Collaborations

Silke has collaborated with various professionals in her field, including her coworker Martin Spahn. Their joint efforts have contributed to advancements in X-ray technology and improved calibration methods.

Conclusion

Silke Reitz is a key figure in the innovation of X-ray technology, with her patents reflecting her commitment to enhancing imaging systems. Her work continues to influence the field and improve diagnostic capabilities in healthcare.

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