Muroran, Japan

Sigeyuki Nitta

This inventor holds 1 USPTO granted patent. Top assignees: Eddio Corporation, Nippon Steel Corporation. Active years: 1989.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sigeyuki Nitta. Retrieved from https://idiyas.com/inventor/sigeyuki-nitta

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1

Forward Citations = 12(Granted Patents)


Company Filing History:


Years Active: 1989

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1 patent (USPTO):Explore Patents

Title: Sigeyuki Nitta: Innovator in Non-Destructive Testing

Introduction

Sigeyuki Nitta is a notable inventor based in Muroran, Japan. He has made significant contributions to the field of non-destructive testing, particularly in the detection of defects in metal. His innovative approach has garnered attention in various industrial sectors.

Latest Patents

Nitta holds a patent for a "Method and apparatus for non-destructively detecting defects in metal." This invention showcases his expertise in developing techniques that ensure the integrity of metal structures without causing damage.

Career Highlights

Throughout his career, Nitta has worked with prominent companies such as Nippon Steel Corporation and Eddio Corporation. His experience in these organizations has allowed him to refine his skills and contribute to advancements in metal testing technologies.

Collaborations

Nitta has collaborated with esteemed colleagues, including Michiaki Takahashi and Mitsuo Yoshida. These partnerships have facilitated the exchange of ideas and fostered innovation in their respective fields.

Conclusion

Sigeyuki Nitta's work in non-destructive testing exemplifies the impact of innovative thinking in engineering. His contributions continue to influence the industry and enhance safety standards in metal applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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