Ichinomiya, Japan

Sigenori Shibata

This inventor holds 1 USPTO granted patent. Top assignee: Sanyo Electric Co., Ltd.. Active years: 2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sigenori Shibata. Retrieved from https://idiyas.com/inventor/sigenori-shibata

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: Sigenori Shibata: Innovator in Semiconductor Technology

Introduction

Sigenori Shibata is a notable inventor based in Ichinomiya, Japan. He has made significant contributions to the field of semiconductor technology. His innovative work has led to the development of a patented semiconductor device that enhances testing efficiency.

Latest Patents

Sigenori Shibata holds a patent for a semiconductor device and method for testing semiconductor devices. This invention allows for the testing of semiconductor chips in a simplified and efficient manner. The device includes a packaged logic chip for processing data and a packaged memory chip for storing data. It features an automatic rewrite circuit that writes test data to the memory circuit based on commands from a tester. Additionally, a selector is included to switch between accessing the memory circuit by the automatic rewrite circuit and the logic circuit.

Career Highlights

Sigenori Shibata is associated with Sanyo Electric Co., Ltd., where he has contributed to advancements in semiconductor technology. His work has been instrumental in improving the functionality and efficiency of semiconductor devices.

Collaborations

Throughout his career, Sigenori has collaborated with notable colleagues such as Sadao Yoshikawa and Tomofumi Watanabe. These collaborations have further enriched his contributions to the field.

Conclusion

Sigenori Shibata's innovative work in semiconductor technology exemplifies the impact of dedicated inventors in advancing modern electronics. His patented device represents a significant step forward in the efficiency of semiconductor testing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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