Bayan Lepas, Malaysia

Siew-Leong Lam

This inventor holds 1 USPTO granted patent. Top assignee: National Instruments Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Siew-Leong Lam. Retrieved from https://idiyas.com/inventor/siew-leong-lam-k3x1msl2

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Siew-Leong Lam: Inventor of a Virtual Resistance Control System.

Introduction

Siew-Leong Lam is an inventor based in Bayan Lepas, Malaysia. His patent work includes a control-system approach designed to improve dynamic performance in constant-voltage operation.

Latest Patents

Lam is associated with 1 patent, titled “System and Method for Virtual Resistance.” The invention describes a control system that can improve dynamic performance in constant-voltage (CV) mode while remaining invariant to the source type and operating point. It achieves this by using a voltage-controlled resistance as the control element in the system’s feedback loop, replacing a voltage-controlled current source, potentially with few or no additional circuit components. The system measures an input voltage from a device under test, determines a feedback control voltage based at least partly on that measurement, and applies the combined voltage to operate the device in CV mode.

Career Highlights

Lam is associated with National Instruments Corporation. His patent reflects work on feedback control and voltage regulation for devices under test.

Collaborations

Lam’s listed coworker is Tatt-Wee Oong. Their association provides context for the professional environment connected with Lam’s patent work.

Conclusion

Siew-Leong Lam’s “System and Method for Virtual Resistance” presents a feedback-control technique intended to improve constant-voltage performance with minimal circuit changes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…