This inventor holds 1 USPTO granted patent. Top assignee: Nanyang Technological University. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Siew Kheng Boong and a Multiplexed SERS Platform for Analyte Analysis.
Introduction
Siew Kheng Boong is an inventor associated with Nanyang Technological University in Singapore. His patent work includes a surface-enhanced Raman scattering (SERS) platform designed to analyze suspected analytes in a sample.
Latest Patents
The supplied information identifies one patent for Boong: “Surface-enhanced Raman scattering (SERS) platform for analysis.” The invention describes a SERS chip that can generate multiple SERS profiles simultaneously. It uses substrates bearing Raman probes, each comprising a SERS-active nanoparticle grafted with a receptor molecule. Different receptor molecules can be used across substrates or among probes on the same substrate.
Each receptor molecule has a thiol group positioned near the nanoparticle and a functional group farther away. The functional group interacts with an analyte, changing the receptor molecule’s vibration in a way that can be detected through SERS. The disclosed method collects signals from the chip after it contacts a sample, combines those signals into a SERS profile, and provides the profile to a device configured with a model trained to identify analytes. The supplied record lists 1 patent.
Career Highlights
Boong’s listed affiliation is Nanyang Technological University. The patent’s focus is combining multiple receptor-based probes with signal analysis to support the identification of one or more analytes from a sample.
Collaborations
The supplied information names Xing Yi Ling and In Yee Phang as Boong’s coworkers. It does not specify their roles in the patent or describe particular collaborative contributions.
Conclusion
Siew Kheng Boong’s listed invention applies multiplexed SERS probes and model-assisted signal analysis to the identification of analytes, reflecting a research focus on analytical sensing technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
