Oberkochen, Germany

Siegfried Gerber

This inventor holds 1 USPTO granted patent. Top assignee: Carl-Zeiss-Stiftung, Heidenheim/brenz. Active years: 1984.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Siegfried Gerber. Retrieved from https://idiyas.com/inventor/siegfried-gerber

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 1984

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1 patent (USPTO):Explore Patents

Title: Siegfried Gerber: Innovator in Microscope Technology

Introduction

Siegfried Gerber is a notable inventor based in Oberkochen, Germany. He has made significant contributions to the field of microscopy through his innovative designs. His work focuses on enhancing the usability and efficiency of microscope specimen holders.

Latest Patents

Gerber holds a patent for a specimen holder for microscopes. This invention features two embodiments that allow for the use of only one hand when changing specimens. The first embodiment includes a spring band that clamps the slide against front-edge stops, while the second features a resiliently supported turnable disc that secures the specimen slide upon insertion.

Career Highlights

Siegfried Gerber is associated with Carl Zeiss Stiftung in Heidenheim, where he has contributed to advancements in optical technology. His work has been instrumental in improving the functionality of microscope accessories.

Collaborations

Throughout his career, Gerber has collaborated with notable colleagues, including Klaus Weber and Horst Fischer. These partnerships have fostered innovation and development in the field of microscopy.

Conclusion

Siegfried Gerber's contributions to microscope technology exemplify the importance of innovation in scientific research. His patented designs enhance the user experience and efficiency in laboratories worldwide.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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