St. Louis, MO, United States of America

Sicheng Wang

This inventor holds 1 USPTO granted patent. Top assignee: Washington University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Sicheng Wang. Retrieved from https://idiyas.com/inventor/sicheng-wang-qrnqhf4b

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Sicheng Wang and Uterine Peristalsis Imaging

Introduction

Sicheng Wang is an inventor associated with Washington University in St. Louis, Missouri. His patent work addresses uterine peristalsis imaging, a noninvasive approach for observing and measuring uterine contractions.

Latest Patents

Wang is associated with 1 patent, titled “Systems and Methods for Uterine Peristalsis Imaging.” The invention describes uterine peristalsis imaging (UPI) as a way to provide objective, quantitative measures of uterine peristalsis. It maps where contractions begin and end while characterizing their direction, duration, and magnitude, taking the individual’s uterine anatomy into account. The methods also introduce indices for quantitatively describing contraction patterns, including their duration and magnitude. The assessment can be performed noninvasively over an extended period with little patient discomfort.

Career Highlights

Wang’s listed patent reflects work on imaging methods designed to make uterine contractile activity more reliably observable and measurable. His affiliation is Washington University.

Collaborations

Yong Wang is identified as Wang’s coworker. The available information does not specify their roles in the patent or the nature of their collaboration.

Conclusion

Sicheng Wang’s patent work focuses on quantitative, three-dimensional imaging of uterine peristalsis, with the aim of characterizing contractions noninvasively and in detail.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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