Shenzhen, China

Si-He Hu

This inventor holds 3 USPTO granted patents and 1 published patent application. Top assignee: Hon Hai Precision Industry Co., Ltd.. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Si-He Hu. Retrieved from https://idiyas.com/inventor/si-he-hu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 3 

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 3

Forward Citations = 33(Granted Patents)


Company Filing History:


Years Active: 2013

Loading Chart...
3 patents (USPTO):Explore Patents

Title: Si-He Hu: Innovator in Banknote Counting Technology

Introduction

Si-He Hu is a prominent inventor based in Shenzhen, China. He has made significant contributions to the field of banknote counting technology. With a total of 3 patents to his name, Hu continues to push the boundaries of innovation in his industry.

Latest Patents

One of Hu's latest inventions is a sophisticated banknote counting machine. This device is designed to enhance the efficiency and accuracy of banknote processing. His work in this area reflects his commitment to improving financial technology.

Career Highlights

Si-He Hu is currently employed at Hon Hai Precision Industry Co., Ltd. His role at this leading technology company allows him to collaborate with other talented professionals in the field. His innovative spirit and technical expertise have made him a valuable asset to his team.

Collaborations

Some of Hu's notable coworkers include Chih-Kun Shih and Wan-Cheng Luo. Together, they work on various projects that aim to advance technology in their respective fields.

Conclusion

Si-He Hu is a dedicated inventor whose work in banknote counting technology showcases his innovative capabilities. His contributions are paving the way for advancements in financial technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…