Austin, TX, United States of America

Shyh Pyng Jack Shue

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Honeywell International Inc.. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shyh Pyng Jack Shue. Retrieved from https://idiyas.com/inventor/shyh-pyng-jack-shue

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Innovations by Shyh Pyng Jack Shue in Solar Panel Inspection

Introduction

Shyh Pyng Jack Shue is an accomplished inventor based in Austin, TX. He has made significant contributions to the field of solar energy through his innovative patent. His work focuses on enhancing the efficiency and reliability of solar panel inspections using advanced technology.

Latest Patents

Shue holds a patent for a method of solar panel inspection by unmanned aerial vehicles (UAVs). This patent outlines a process for detecting faults in solar panels within solar farms. The method involves capturing images of the solar panels during two separate flights of the UAV. A computing system analyzes these images to determine scores for the solar panels, ultimately identifying any faults present.

Career Highlights

Shyh Pyng Jack Shue is associated with Honeywell International Inc., where he applies his expertise in technology and innovation. His work at Honeywell has allowed him to collaborate with other talented professionals in the field.

Collaborations

One of his notable coworkers is Chao Li, with whom he has likely shared insights and expertise in their projects.

Conclusion

Shyh Pyng Jack Shue's contributions to solar panel inspection technology demonstrate his commitment to innovation in renewable energy. His patent reflects a significant advancement in the efficiency of solar energy systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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