Hyderabad Telangana, India

Shyam Nandan Rai

This inventor holds 1 USPTO granted patent. Top assignees: Indian Institute of Technology Delhi, Indian Institute of Technology Hyderabad, International Institute of Information Technology, Hyderabad. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shyam Nandan Rai. Retrieved from https://idiyas.com/inventor/shyam-nandan-rai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Innovations by Shyam Nandan Rai

Introduction

Shyam Nandan Rai is an accomplished inventor based in Hyderabad, Telangana, India. He has made significant contributions to the field of image processing, particularly in developing methods that enhance image quality through innovative techniques.

Latest Patents

Shyam Nandan Rai holds a patent for a "System and method for generating derained image using self-supervised learning model." This method involves several steps, including processing an input image, classifying pixels as rainy or non-rainy, generating a masked area by masking out rainy pixels, creating an inpainted image, and finally generating an optimized image that improves semantic segmentation and object detection.

Career Highlights

Throughout his career, Shyam has worked with prestigious institutions such as the International Institute of Information Technology, Hyderabad, and the Indian Institute of Technology Delhi. His work has focused on advancing the capabilities of image processing technologies.

Collaborations

Shyam has collaborated with notable colleagues, including Cv Jawahar and Rohit Saluja, contributing to various projects and research initiatives.

Conclusion

Shyam Nandan Rai's innovative work in image processing exemplifies the impact of technology on enhancing visual data interpretation. His contributions continue to influence the field and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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