Fremont, CA, United States of America

Shuw-Shenn Luh

This inventor holds 1 USPTO granted patent. Top assignee: Optovue, Inc.. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shuw-Shenn Luh. Retrieved from https://idiyas.com/inventor/shuw-shenn-luh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 26(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Shuw-Shenn Luh: Innovator in Optical Coherence Tomography

Introduction

Shuw-Shenn Luh is a notable inventor based in Fremont, California. He has made significant contributions to the field of optical coherence tomography, particularly through his innovative methods for eye registration.

Latest Patents

Luh holds a patent for a "Method of Eye Registration for Optical Coherence Tomography." This patent discloses a method that includes acquiring scan pattern scans, forming images from these scans, registering the images, generating a feature map from the scans, identifying features on the feature map, and recording positional information of these features. His work enhances the accuracy and efficiency of eye examinations.

Career Highlights

Shuw-Shenn Luh is associated with Optovue, Inc., a company that specializes in advanced optical imaging technology. His role at Optovue has allowed him to apply his expertise in developing innovative solutions for eye care.

Collaborations

Luh has collaborated with notable colleagues such as Jay Wei and Ben Jang, contributing to advancements in their shared field of optical technology.

Conclusion

Shuw-Shenn Luh's contributions to optical coherence tomography exemplify the impact of innovation in medical technology. His patent and work at Optovue, Inc. highlight his commitment to improving eye care through advanced imaging techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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