Shanghai, China

Shunli Cheng

This inventor holds 1 USPTO granted patent. Top assignee: Horizon (Shanghai) Artificial Intelligence Technology Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shunli Cheng. Retrieved from https://idiyas.com/inventor/shunli-cheng-auyu0y8n

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Shunli Cheng: Innovator in Security Control for Integrated Circuits

Introduction

Shunli Cheng is a prominent inventor based in Shanghai, China. He has made significant contributions to the field of integrated circuit security. His innovative approach focuses on enhancing the reliability and safety of electronic devices.

Latest Patents

Shunli Cheng holds a patent for a "Security control method and apparatus for integrated circuit, storage medium, and electronic device." This invention provides a comprehensive security control method that includes determining error data from a target control module and processing it to enhance security measures. The method supports the collection and processing of a vast amount of error data, ensuring the integrity of integrated circuits.

Career Highlights

Cheng is currently associated with Horizon (Shanghai) Artificial Intelligence Technology Co., Ltd. His work at this company emphasizes the integration of artificial intelligence with security technologies. His innovative solutions have positioned him as a key player in the industry.

Collaborations

Shunli Cheng has collaborated with notable colleagues, including Wenxing Li and Jing Li. Their combined expertise contributes to the advancement of technology in their field.

Conclusion

Shunli Cheng's contributions to security control methods for integrated circuits highlight his role as an influential inventor. His work continues to impact the technology landscape positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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