Tatebayashi, Japan

Shunichi Iizuka

This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Adeka Argus Chemical Co., Ltd.. Active years: 1990.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shunichi Iizuka. Retrieved from https://idiyas.com/inventor/shunichi-iizuka

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

 

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 27(Granted Patents)


Company Filing History:


Years Active: 1990

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1 patent (USPTO):Explore Patents

Title: Shunichi Iizuka - Innovator in Detection Technology

Introduction: Shunichi Iizuka is an inventor based in Tokyo, Japan. He is currently associated with Fcl Components Limited. Although he has not yet been granted any patents, his work in detection technology is noteworthy.

Latest Patent Applications: One of his significant patent applications is titled "Detection Device and Detection Method." This application describes a detection device that includes a transmitter configured to transmit an electromagnetic wave or a sound wave as a transmission signal. It also features a receiver that receives a signal obtained by reflecting the transmission signal from an object, serving as a reception signal. The device includes a mixer that combines the transmission and reception signals to produce a mixed signal, which is then processed by a detector. The detector is designed to detect both the motion of the object and the distance to the object, utilizing a two-tier sampling method for enhanced accuracy.

Conclusion: Shunichi Iizuka's contributions to detection technology, particularly through his innovative patent applications, highlight his potential as an inventor in this field. His work may pave the way for future advancements in detection devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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