Mito, Japan

Shuji Sugiyama


Average Co-Inventor Count = 2.3

ph-index = 4

Forward Citations = 68(Granted Patents)


Location History:

  • Katsuta, JP (1984 - 1987)
  • Mito, JP (1990 - 2004)

Company Filing History:


Years Active: 1984-2004

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8 patents (USPTO):Explore Patents

Title: Innovations of Shuji Sugiyama

Introduction

Shuji Sugiyama is a prominent inventor based in Mito, Japan. He has made significant contributions to the field of semiconductor technology. With a total of 8 patents to his name, his work has had a profound impact on the industry.

Latest Patents

Sugiyama's latest patents include a variety of innovative technologies. These patents are: WORKPIECE HOLDER, SEMICONDUCTOR FABRICATING APPARATUS, SEMICONDUCTOR INSPECTING APPARATUS, CIRCUIT PATTERN INSPECTING APPARATUS, CHARGED PARTICLE BEAM APPLICATION APPARATUS, CALIBRATING SUBSTRATE, WORKPIECE HOLDING METHOD, CIRCUIT PATTERN INSPECTING METHOD, and CHARGED PARTICLE BEAM APPLICATION METHOD. His inventions focus on improving the accuracy and efficiency of semiconductor fabrication processes. For instance, his work on calibrating substrates allows for precise measurements of surface heights, which is crucial for ensuring the quality of semiconductor devices.

Career Highlights

Sugiyama is currently employed at Hitachi, Ltd., where he continues to innovate in semiconductor technology. His career has been marked by a commitment to enhancing the reliability of semiconductor devices. He has developed methods that reduce defects in circuit patterns, thereby increasing the overall quality of semiconductor products.

Collaborations

Throughout his career, Sugiyama has collaborated with notable colleagues, including Hiroyuki Suzuki and Hiroyuki Shinada. These collaborations have further enriched his work and contributed to advancements in the field.

Conclusion

Shuji Sugiyama's contributions to semiconductor technology through his patents and innovations have established him as a key figure in the industry. His work continues to influence the development of reliable and efficient semiconductor devices.

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