Hangzhou, China

Shui-Jun Lu

This inventor holds 1 USPTO granted patent. Top assignee: Arcsoft Corporation Limited. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shui-Jun Lu. Retrieved from https://idiyas.com/inventor/shui-jun-lu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: Innovations of Shui-Jun Lu in Image Processing

Introduction

Shui-Jun Lu is a notable inventor based in Hangzhou, China. He has made significant contributions to the field of image processing, particularly through his innovative methods for image separation. His work is recognized for its practical applications in electronic devices.

Latest Patents

Shui-Jun Lu holds a patent for a method titled "Method for Image Separating." This method is designed to separate the foreground and background of an image displayed on electronic apparatuses. The process involves scanning pixels, applying arithmetic algorithms, and forming segments based on color similarity. The method allows users to label foreground and background regions, merging segments accordingly until a clear separation is achieved.

Career Highlights

Lu is currently associated with Arcsoft Corporation Limited, where he continues to develop and refine his innovative techniques in image processing. His expertise has contributed to advancements in the company's technology offerings.

Collaborations

Some of his notable coworkers include Min Cheng and Miao Hu, who collaborate with him on various projects within the company.

Conclusion

Shui-Jun Lu's contributions to image processing through his patented methods demonstrate his innovative spirit and technical expertise. His work continues to influence the development of electronic imaging technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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