Kawasaki, Japan

Shuhei Sato


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Location History:

  • Yokohama, JP (2013 - 2014)
  • Kawasaki, JP (2012 - 2016)

Company Filing History:


Years Active: 2012-2016

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4 patents (USPTO):Explore Patents

Title: Innovations of Shuhei Sato

Introduction

Shuhei Sato is a notable inventor based in Kawasaki, Japan. He has made significant contributions to the field of semiconductor technology, holding a total of 4 patents. His work primarily focuses on methods and systems that enhance the functionality and debugging of integrated circuits.

Latest Patents

One of his latest patents is an execution history tracing method. This method involves tracing the execution history of a CPU while executing a program in a semiconductor device. It records target information as trace information about the execution for each instruction cycle, allowing for effective data sorting and analysis. Another significant patent is related to an integrated circuit and debugging circuit. This invention includes a processing unit that executes user programs and a debugging circuit that facilitates command transfers in response to requests from the processing unit. This innovation enhances the efficiency of debugging processes in semiconductor devices.

Career Highlights

Shuhei Sato has worked with prominent companies in the semiconductor industry, including Spansion LLC and Cypress Semiconductor Corporation. His experience in these organizations has contributed to his expertise in developing advanced semiconductor technologies.

Collaborations

Throughout his career, Shuhei has collaborated with talented individuals such as Yuichi Sato and Takashi Sato. These collaborations have likely fostered innovative ideas and advancements in their respective fields.

Conclusion

Shuhei Sato's contributions to semiconductor technology through his patents and career achievements highlight his role as a significant inventor in the industry. His work continues to influence advancements in integrated circuits and debugging methods.

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