Hong Kong, China

Shu Kin Lok

This inventor holds 1 USPTO granted patent. Top assignees: The Hong Kong University of Science and Technology, University of Macau. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shu Kin Lok. Retrieved from https://idiyas.com/inventor/shu-kin-lok

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: The Innovations of Shu Kin Lok

Introduction

Shu Kin Lok is a notable inventor based in Hong Kong, CN. He has made significant contributions to the field of UV detection technology. His innovative work has led to the development of a unique solar-blind UV radiation detector.

Latest Patents

Shu Kin Lok holds a patent for a MgS solar-blind UV radiation detector. This UV detector is designed to provide a photoresponse with a cutoff wavelength below a predetermined wavelength. The detector utilizes a sensor element with an active layer comprising a MgS component that is grown directly on a substrate. Additionally, a thin metal layer is deposited over the active layer, forming a transparent Schottky metal layer.

Career Highlights

Throughout his career, Shu Kin Lok has worked with prestigious institutions such as the University of Macau and The Hong Kong University of Science and Technology. His experience in these academic environments has allowed him to advance his research and contribute to the scientific community.

Collaborations

Shu Kin Lok has collaborated with notable colleagues, including Ying Hoi Lai and Wai Yip Cheung. These partnerships have further enriched his research endeavors and innovations.

Conclusion

Shu Kin Lok's contributions to UV detection technology exemplify the impact of innovative thinking in scientific research. His work continues to influence the field and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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