Yokohama, Japan

Shouta Tanaka

This inventor holds 1 USPTO granted patent and 10 published patent applications. Top assignee: Toyo Seikan Co., Ltd.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shouta Tanaka. Retrieved from https://idiyas.com/inventor/shouta-tanaka

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Shouta Tanaka: Innovator in Container Manufacturing

Introduction

Shouta Tanaka is a notable inventor based in Yokohama, Japan. He has made significant contributions to the field of container manufacturing, showcasing his innovative spirit through his patented methods.

Latest Patents

Tanaka holds a patent for a "Method for manufacturing container and apparatus for manufacturing container." This invention allows for the easy manufacturing of containers that feature a body portion expanding outward toward the upper face side. The method involves a bottom drawing step that reduces the diameter of a metal cup body through a series of operations, making it efficient and effective.

Career Highlights

Tanaka is associated with Toyo Seikan Co., Ltd., a company renowned for its advancements in packaging technology. His work has contributed to the company's reputation as a leader in the industry.

Collaborations

Tanaka has collaborated with talented coworkers, including Takeshi Murase and Nobuhiro Sasajima. Their combined efforts have fostered innovation within their projects.

Conclusion

Shouta Tanaka's contributions to container manufacturing highlight his inventive capabilities and dedication to advancing technology in this field. His patent reflects a significant step forward in manufacturing processes, showcasing the importance of innovation in industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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