This inventor holds 2 USPTO granted patents and 1 EPO patent. Top assignee: Other. Active years: 2020-2021.
Company Filing History:
2 out of 834,350 Years Active: 2020-2021
Title: Innovations of Shouqi Wei in Deflection Scanning Technology.
Introduction
Shouqi Wei is an accomplished inventor based in Guilin, China. He has made significant contributions to the field of deflection scanning technology, holding a total of 2 patents. His work focuses on improving the accuracy and efficiency of scanning devices through innovative control methods.
Latest Patents
Shouqi Wei's latest patents include a "Control method for multi-phase winding deflection scanning device" and a "Deflection scanning device with multi-phase winding and deflection scanning system." The control method patent discloses a systematic approach to defining a rectangular coordinate system for deflection scanning tracks. It involves decomposing these tracks into finite point rectangular coordinate data and translating them into resultant exciting current data. This data is further decomposed into n-phase winding exciting current data, which is then converted into control instruction electrical signals for the drive power supply. The second patent describes a deflection scanning device that features an axisymmetric structure, designed to enhance the uniformity of magnetic induction intensity in charged particle beam channels. This innovation aims to reduce defocusing effects and improve scanning accuracy.
Career Highlights
Throughout his career, Shouqi Wei has worked with various companies, including Guilin Thd Technology Co., Ltd. His expertise in deflection scanning technology has positioned him as a key figure in the development of advanced scanning systems.
Collaborations
Shouqi Wei has collaborated with notable individuals in his field, including Xiaodong Huang and Xiang Fei. These partnerships have contributed to the advancement of his innovative projects and patents.
Conclusion
Shouqi Wei's contributions to deflection scanning technology demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of the complexities involved in scanning systems, paving the way for future advancements in the field.