Kyoto, Japan

Shojo Sakai

This inventor holds 1 USPTO granted patent. Top assignee: Murata Kikai Kabushiki Kaisha. Active years: 1985.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shojo Sakai. Retrieved from https://idiyas.com/inventor/shojo-sakai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 25(Granted Patents)


Company Filing History:


Years Active: 1985

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1 patent (USPTO):Explore Patents

Title: The Innovations of Shojo Sakai

Introduction

Shojo Sakai is a notable inventor based in Kyoto, Japan. She has made significant contributions to the field of textile technology. Her innovative work focuses on improving the analysis of yarn evenness, which is crucial for the textile industry.

Latest Patents

Sakai holds a patent for a "Method and apparatus for analysis of information about yarn evenness." This invention features a yarn evenness detector in a textile machine that generates an analog signal in response to yarn unevenness. The analog signal is then digitized and subjected to real-time processing in a computer for the analysis of both cyclic and non-cyclic yarn irregularity. Additionally, a signal may be generated in response to irregularities exceeding a certain value. This patent showcases her expertise in enhancing textile manufacturing processes.

Career Highlights

Sakai is currently employed at Murata Kikai Kabushiki Kaisha, where she continues to develop innovative solutions in textile technology. Her work has been instrumental in advancing the efficiency and quality of yarn production.

Collaborations

Sakai collaborates with talented colleagues, including Hisaaki Kato and Yoshihiko Samoto. Their combined efforts contribute to the ongoing success of their projects and innovations.

Conclusion

Shojo Sakai's contributions to the textile industry through her innovative patent demonstrate her commitment to enhancing manufacturing processes. Her work continues to influence the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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