Iruma, Japan

Shoji Hayashibe

This inventor holds 1 USPTO granted patent. Top assignees: Eddio Corporation, Nippon Steel Corporation. Active years: 1989.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shoji Hayashibe. Retrieved from https://idiyas.com/inventor/shoji-hayashibe

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 8.0

ph-index = 1

Forward Citations = 12(Granted Patents)


Company Filing History:


Years Active: 1989

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1 patent (USPTO):Explore Patents

Title: The Innovations of Shoji Hayashibe

Introduction

Shoji Hayashibe is a notable inventor based in Iruma, Japan. He has made significant contributions to the field of metal defect detection. His innovative approach has led to the development of a unique patent that enhances the quality control processes in manufacturing.

Latest Patents

Hayashibe holds a patent for a "Method and apparatus for non-destructively detecting defects in metal." This invention is crucial for industries that rely on the integrity of metal components, ensuring safety and reliability in various applications. He has 1 patent to his name, showcasing his expertise in this specialized area.

Career Highlights

Throughout his career, Shoji Hayashibe has worked with prominent companies such as Nippon Steel Corporation and Eddio Corporation. His experience in these organizations has allowed him to refine his skills and contribute to advancements in metal detection technologies.

Collaborations

Hayashibe has collaborated with esteemed colleagues, including Michiaki Takahashi and Mitsuo Yoshida. These partnerships have fostered innovation and have been instrumental in the development of his patented technology.

Conclusion

Shoji Hayashibe's contributions to the field of metal defect detection exemplify the impact of innovative thinking in engineering. His work continues to influence quality control practices in manufacturing industries.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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