Osaka, Japan

Shoichi Kondo

This inventor holds 1 USPTO granted patent. Top assignee: Nippon Sheet Glass Company, Limited. Active years: 1994.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shoichi Kondo. Retrieved from https://idiyas.com/inventor/shoichi-kondo-4jultk30

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 1994

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1 patent (USPTO):Explore Patents

Title: The Innovations of Shoichi Kondo

Introduction

Shoichi Kondo is a notable inventor based in Osaka, Japan. He is recognized for his contributions to the field of glass manufacturing, particularly in the detection of flaws in glass plates. His innovative approach has led to advancements in quality control processes within the industry.

Latest Patents

Kondo holds a patent for an "Apparatus for detecting cut-edge flaws in glass plates." This invention plays a crucial role in ensuring the integrity and quality of glass products, which is essential for various applications in construction and manufacturing.

Career Highlights

Kondo is affiliated with Nippon Sheet Glass Company, Limited, where he applies his expertise in glass technology. His work has significantly impacted the company's production processes and quality assurance measures.

Collaborations

Throughout his career, Kondo has collaborated with esteemed colleagues such as Igisu Masao and Yoshiomi Toyota. These partnerships have fostered a creative environment that encourages innovation and the development of new technologies.

Conclusion

Shoichi Kondo's contributions to the glass industry through his patent and collaborative efforts highlight his importance as an inventor. His work continues to influence quality control practices in glass manufacturing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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