Toyota, Japan

Shoichi Banno

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Sysmex Corporation. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shoichi Banno. Retrieved from https://idiyas.com/inventor/shoichi-banno

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: The Innovations of Shoichi Banno

Introduction

Shoichi Banno is a notable inventor based in Toyota, Japan. He has made significant contributions to the field of thermal detection technology. His work is characterized by a focus on practical applications that enhance monitoring capabilities.

Latest Patents

Banno holds a patent for a thermal history detection label and reagent kit. This innovative label is designed to detect thermal history over a monitored temperature range while minimizing the increase in label size. The thermal history detection label operates by allowing a molten permeating material to permeate into a permeation body. It includes a first permeating material with a lower melting point and a second permeating material with a higher melting point, ensuring effective thermal monitoring.

Career Highlights

Banno is currently employed at Sysmex Corporation, where he continues to develop and refine his inventions. His work at Sysmex has positioned him as a key player in the field of thermal detection technologies.

Collaborations

Some of his notable coworkers include Kazuyoshi Horii and Ken Odashiro. Their collaborative efforts contribute to the innovative environment at Sysmex Corporation.

Conclusion

Shoichi Banno's contributions to thermal detection technology exemplify the impact of innovative thinking in practical applications. His patent for the thermal history detection label showcases his commitment to advancing monitoring technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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