Shiyuzo Shiozaki

Title: Shiyuzo Shiozaki: Innovator in Semiconductor Testing Technology

Introduction

Shiyuzo Shiozaki is a notable inventor based in Tsukuba, Japan. He has made significant contributions to the field of semiconductor technology, particularly in the area of testing circuits. His innovative approach has led to the development of a unique semiconductor device test circuit.

Latest Patents

Shiozaki holds a patent for a semiconductor device test circuit that includes test enable circuitry. This circuit is designed for inclusion on a semiconductor chip, allowing for a test mode that does not interfere with the normal operation of the semiconductor device. The test mode can be activated without applying a voltage higher than the power supply voltage to an external terminal. The circuit features a decoder that detects the matching of a first address input corresponding to the test mode, along with a latch circuit that retains the matching signal. Subsequent decoder circuits and latch circuits process additional address inputs to activate the test mode when a specific combination of addresses is detected.

Career Highlights

Throughout his career, Shiyuzo Shiozaki has worked with prominent companies in the technology sector. He has been associated with Texas Instruments Corporation and Hitachi, Ltd., where he contributed to advancements in semiconductor technology. His work has been instrumental in enhancing the efficiency and reliability of semiconductor devices.

Collaborations

Shiozaki has collaborated with notable colleagues, including Shunichi Sukegawa and Hiromi Matsuura. These collaborations have fostered innovation and development in the semiconductor field.

Conclusion

Shiyuzo Shiozaki's contributions to semiconductor testing technology exemplify his innovative spirit and dedication to advancing the field. His patent for a semiconductor device test circuit showcases his ability to create solutions that enhance device functionality.