Shanghai, China

Shiying Li

This inventor holds 1 USPTO granted patent. Top assignee: Shanghaitech University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Shiying Li. Retrieved from https://idiyas.com/inventor/shiying-li-8wu0hil9

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Shiying Li: Innovator in Non-Line-of-Sight Imaging

Introduction

Shiying Li is a prominent inventor based in Shanghai, China. He has made significant contributions to the field of imaging technology, particularly through his innovative work on non-line-of-sight (NLOS) imaging. His research focuses on developing advanced neural modeling frameworks that enhance imaging capabilities.

Latest Patents

Shiying Li holds a patent for a groundbreaking invention titled "Non-line-of-sight imaging via neural transient field." This novel framework, known as Neural Transient Field (NeTF), is designed to recover the 5D transient function in both spatial location and direction. The training data input for NeTF is parametrized on spherical wave-fronts, allowing for improved imaging accuracy. Additionally, a Markov chain Monte Carlo (MCMC) algorithm is employed to address issues related to sparse and unbalanced sampling in NeTF. He has 1 patent to his name.

Career Highlights

Shiying Li is affiliated with Shanghaitech University, where he continues to advance his research in imaging technologies. His work has garnered attention for its innovative approach and potential applications in various fields.

Collaborations

Shiying Li collaborates with talented individuals such as Siyuan Shen and Zi Wang, contributing to a dynamic research environment that fosters innovation and creativity.

Conclusion

Shiying Li's contributions to non-line-of-sight imaging represent a significant advancement in the field. His innovative approaches and collaborative efforts continue to push the boundaries of imaging technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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